Examination of Metallic Materials for Technical Cleanliness
Our Laboratory Services for Material and Surface Analysis
In our laboratory, we carry out comprehensive metal analyses to accurately determine the composition of alloys and metals. Each sample is carefully prepared before we apply various tailored analytical methods. These include techniques such as ICP-MS, ion chromatography, OES, SEM-EDX, and XRF. This allows us to perform measurements and analyses that provide insights into material properties and quality.
Inorganic Parameters & Metallic Contaminants
For the determination of metallic elements, we use techniques such as ICP-MS and SEM-EDX.
This combination, along with XRF, OES, and other methods, enables precise material analysis and provides reliable data on composition and material properties.
Ion chromatography (anions and cations)
ICP-MS and ICP-MS/MS for the Determination of Elements and Trace Elements
Scanning Electron Microscopy (SEM) with Energy-Dispersive X-ray Analysis (EDX) for Inorganic Contaminants
Chromatography for Chemical Contaminants on Surfaces
In this area, the focus is on the analysis of organic residues. Samples collected from surfaces—using methods such as rinse-off or swab techniques—can subsequently be analyzed, depending on the requirements, using GC and HPLC methods to detect chemical contaminants and assess material properties.
GC Analysis Following Surface Desorption
Gas chromatography (GC) is used to analyze volatile organic substances on metal surfaces. After sampling the surfaces, the chemical residues present can be accurately identified and quantified, which is particularly relevant for evaluating cleaning processes and surface quality.
HPLC Analyses for the Determination of Organic Residues
High-performance liquid chromatography (HPLC) enables the precise measurement of non-volatile organic residues on metals. This method also allows the separation and determination of complex mixtures and higher-molecular-weight compounds, making it possible to assess surface quality and potential process-related contaminants.
Residue determination and particulate contamination
This section focuses on physical particles and visible residues. Methods such as optical microscopy, FT-IR, or SEM-EDX enable the examination, classification, and analysis of particles. The data obtained help to assess material properties and optimize manufacturing processes.
FT-IR spectroscopy for organic residues
FT-IR spectroscopy (Fourier transform infrared spectroscopy) is used to analyze organic residues on metals and materials. It provides information on chemical structures and functional groups, allowing even small contaminants to be detected. In contrast to GC or HPLC, FT-IR enables rapid measurements with less extensive sample preparation.
SEM-EDX according to DIN ISO 22309 for inorganic particles
This specialized SEM-EDX method in accordance with DIN ISO 22309 allows the standardized determination of the elemental composition of inorganic particles on materials. It is primarily used to detect contamination in manufacturing processes and to precisely characterize alloys or metals. Unlike conventional SEM-EDX, this approach focuses on standardized testing procedures for quality assurance.
Optical microscopy (JOMESA) for particle classification
Using optical microscopy (JOMESA), particles on metals and materials can be visualized and classified according to size, shape, and origin. This method is particularly suitable for assessing the distribution of contaminants on surfaces. It complements SEM-EDX by revealing structure-related properties that are not based on elemental composition.
Sampling, measurement, and detection limits
Standardized sampling is crucial for the reliability of the analysis. Our methods ensure precise measurements and well-defined detection limits, allowing even trace elements and residues to be reliably detected.
Applications in manufacturing, quality assurance, and complaint analysis
The results of our materials analyses are applied in manufacturing, quality assurance, and complaint management. They support the optimization of technical processes, assist in monitoring alloys, steel, and other materials, and help detect contaminants to improve product quality.
FAQ on Analysis, Contaminants, and Applied Methods
Here, we answer questions regarding materials analyses, measurement methods such as OES, XRF, SEM-EDX, and ICP-MS, and the determination of contaminants. The aim is to provide well-founded information and transparent results.
How is the analysis of metals and materials carried out at your facility?
The analysis of metals and materials at our facility is conducted through careful sampling, followed by metal characterization using state-of-the-art methods such as ICP-MS (inductively coupled plasma mass spectrometry), SEM-EDX (scanning electron microscopy with energy-dispersive X-ray spectroscopy), OES (optical emission spectrometry), and XRF (X-ray fluorescence analysis). This allows for precise determination of the chemical composition of alloys, identifying both the constituent elements and any potential contaminants. Metallography is additionally employed to examine the material’s properties and structures in detail. The result is a comprehensive materials analysis that provides a reliable assessment of quality and suitability for application.
How do you detect inorganic and metallic contaminants using ion chromatography?
The analysis of inorganic and metallic contaminants at our facility is carried out using ion chromatography (IC) following targeted sample preparation. The sample is brought into solution, allowing dissolved ions and charge carriers to be separated and measured with high sensitivity. This analysis enables the precise determination of even trace contaminants, providing a reliable assessment of the composition, properties, and quality of the material under investigation. In combination with complementary methods such as OES or XRF, we achieve a comprehensive solution for the chemical analysis and evaluation of metallic materials.
When do you use ICP-MS for the determination of elements and trace elements?
ICP-MS (inductively coupled plasma mass spectrometry) is used when highly precise determination of elements in metals, alloys, or other materials is required. It is particularly suitable for samples where even trace concentrations or minute contaminants need to be detected. Thanks to its extremely low detection limits, ICP-MS provides accurate results on composition and enables detailed materials analysis.
What is scanning electron microscopy (SEM) used for in the analysis of inorganic contaminants?
Scanning electron microscopy with energy-dispersive X-ray analysis (SEM-EDX) is used to examine the surface structure and elemental composition of inorganic contaminants in metals, alloys, or materials. This method allows microscopic particles to be visualized and their elemental content to be determined precisely. As a result, the properties, contaminants, and origin of the particles can be analyzed, providing insights into the quality of the materials and manufacturing processes.
How does chromatography (GC, HPLC) work for the analysis of chemical contaminants on surfaces?
Chromatography (GC, HPLC) is used for the analysis of chemical contaminants on surfaces by first preparing the sample and then passing the dissolved substances through a separation column. These methods allow individual components to be precisely identified and the surface composition to be accurately determined. The results provide important information about contaminants, material properties, and enable reliable materials analysis as well as quality control.
Which residues can be identified using FT-IR spectroscopy?
Using FT-IR spectroscopy, we can analyze various chemical residues on metals, alloys, and other materials. This method enables the determination of the composition of organic and inorganic substances, including oils, fats, cleaning agents, and corrosion products. Contaminants can thus be reliably detected, material properties assessed, and precise materials analysis and quality control performed.
How is particulate contamination analysis performed according to DIN ISO 22309 using SEM-EDX?
Particulate contamination analysis according to DIN ISO 22309 is performed on metals and alloys using SEM-EDX. The sample is first prepared, after which the particles are visualized with the scanning electron microscope (SEM) and their elemental composition is determined using EDX spectroscopy. These methods enable precise identification of elements, detection of contaminants, and assessment of material properties. The results provide a reliable materials analysis and support process optimization as well as assurance of material quality.
Which components and materials are suitable for light optical microscopy?
Metals, alloys, and industrial materials are suitable for analysis using light optical microscopy when surface structure and particulate contamination need to be examined. Typical components include steel parts or precision components, where metal analysis, metallography, and assessment of properties and material quality are required.
What detection limits do your methods achieve for metallic and organic contaminants?
The analysis of metallic and organic contaminants is carried out using highly precise methods such as OES, XRF, ICP-MS, or FT-IR. Depending on the sample, the elements, and the method, very low detection limits can be achieved, allowing even trace contaminants to be reliably identified. Specific requirements regarding detection and quantification limits depend on the analytes, regulatory guidelines, and the needs of the respective market sectors.
Why is sampling crucial for obtaining reliable analysis results?
Sampling is crucial for the precise analysis of metals, alloys, and other materials. Only when a sample is correctly collected and, if necessary, prepared or dissolved can methods such as ICP-MS, SEM-EDX, IC, OES, or other analyses reliably determine composition, elements, and contaminants. Careful sample preparation forms the basis for reproducible measurements, meaningful results, and a robust materials analysis, enabling conclusions about the properties and quality of the materials.
Contact and Request an Analysis
Send your samples to our laboratory to have a professional materials analysis carried out. We provide precise measurements, reliable results, and expert guidance on metals, alloys, and other materials.
Metal
Dr. Zarema Bekirova
M.Sc. Chemistry
- Element analysis
